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portada Semiconductor Reliability, V2
Type
Physical Book
Language
English
Pages
416
Format
Hardcover
Dimensions
22.9 x 15.2 x 2.4 cm
Weight
0.72 kg.
ISBN13
9781258718404

Semiconductor Reliability, V2

Alven, William H. Von ; Nucci, E. J. (Author) · Literary Licensing, LLC · Hardcover

Semiconductor Reliability, V2 - Alven, William H. Von ; Nucci, E. J.

New Book Imported to Taiwan
Delivery: 07 Sep - 18 Sep Shipping: 17 to 21 business days.
NT$ 2,392
NT$ 2,392

Synopsis "Semiconductor Reliability, V2"

Additional Contributors Include A. Procassini, A. Romano, Lawrence F. Jones And Others.

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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.

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