Name: Ellipsometry: Principles and Techniques for Materials Characterization
SKU: 58995458
Price: 4576.00 TWD
Availability: InStock
Author: Wahaia, Faustino
ISBN: 9789535136231

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portada Ellipsometry: Principles and Techniques for Materials Characterization

Ellipsometry: Principles and Techniques for Materials Characterization

Type

Physical Book

Publisher

Intechopen

Author

Wahaia, Faustino

Language

English

Pages

162

Format

Hardcover

Dimensions

24.4x17x1.1 cm

Weight

0.46 kg.

ISBN13

9789535136231

Synopsis "Ellipsometry: Principles and Techniques for Materials Characterization"

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.

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Ellipsometry: Principles and Techniques for Materials Characterization - Wahaia, Faustino

Synopsis "Ellipsometry: Principles and Techniques for Materials Characterization"

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