Name: Active Probe Atomic Force Microscopy. A Practical Guide on Precision Instrumentation
SKU: 64795497
Price: 2303.00 TWD
Availability: InStock
Author: Fangzhou Xia;Kamal Youcef-Toumi;Ivo W. Rangelow
ISBN: 9783031442353

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Active Probe Atomic Force Microscopy. A Practical Guide on Precision Instrumentation

Type

Physical Book

Publisher

Springer International Publishing AG

Author

Fangzhou Xia;Kamal Youcef-Toumi;Ivo W. Rangelow

Year

2025

Pages

366

Format

Paperback

Dimensions

23.5x15.5 cm

ISBN13

9783031442353

Active Probe Atomic Force Microscopy. A Practical Guide on Precision Instrumentation

Fangzhou Xia;Kamal Youcef-Toumi;Ivo W. Rangelow (Author) · Springer International Publishing AG · Paperback

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Synopsis "Active Probe Atomic Force Microscopy. A Practical Guide on Precision Instrumentation"

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).