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portada Electrical Atomic Force Microscopy for Nanoelectronics
Type
Physical Book
Publisher
Author
Language
English
Pages
408
Format
Hardcover
Dimensions
23.4 x 15.6 x 2.4 cm
Weight
0.78 kg.
ISBN13
9783030156114
Categories

Electrical Atomic Force Microscopy for Nanoelectronics

Celano, Umberto (Author) · Springer · Hardcover

Electrical Atomic Force Microscopy for Nanoelectronics - Celano, Umberto

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