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portada Electron Microscopy and Analysis
Type
Physical Book
Publisher
Language
English
Pages
264
Format
Hardcover
ISBN13
9781138441538
Edition No.
0003

Electron Microscopy and Analysis

Peter J. Goodhew (Author) · John Humphreys (Author) · Richard Beanland (Author) · CRC Press · Hardcover

Electron Microscopy and Analysis - Goodhew, Peter J. ; Humphreys, John ; Beanland, Richard

New Book Imported to Taiwan
Delivery: 28 Oct - 10 Nov Shipping: 14 to 18 business days.
NT$ 10,567
NT$ 10,567

Synopsis "Electron Microscopy and Analysis"

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

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The book is written in English.
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