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portada Elements of Electromigration: Electromigration in 3d ic Technology
Type
Physical Book
Publisher
Author
Language
English
Pages
132
Format
Hardcover
ISBN13
9781032470276
Edition No.
1

Elements of Electromigration: Electromigration in 3d ic Technology

K. N. Tu Yingxia Liu (Author) · Crc Press · Hardcover

Elements of Electromigration: Electromigration in 3d ic Technology - K. N. Tu Yingxia Liu

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Synopsis "Elements of Electromigration: Electromigration in 3d ic Technology"

In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

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The binding of this edition is Hardcover.

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