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portada microscopy of semiconducting materials: proceedings of the 14th conference, april 11-14, 2005, oxford, uk
Type
Physical Book
Publisher
Year
2010
Language
English
Pages
540
Format
Paperback
Dimensions
23.4 x 15.6 x 2.9 cm
Weight
0.77 kg.
ISBN
3642068707
ISBN13
9783642068706

microscopy of semiconducting materials: proceedings of the 14th conference, april 11-14, 2005, oxford, uk

A. G. Cullis (Illustrated by) · John L. Hutchison (Illustrated by) · Springer · Paperback

microscopy of semiconducting materials: proceedings of the 14th conference, april 11-14, 2005, oxford, uk - Cullis, A. G. ; Hutchison, John L.

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Synopsis "microscopy of semiconducting materials: proceedings of the 14th conference, april 11-14, 2005, oxford, uk"

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

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