Name: Modeling and Characterization of rf and Microwave Power Fets Paperback (The Cambridge rf and Microwave Engineering Series)
Price: 4299.00 TWD
Availability: InStock
Author: Aaen, Peter ; Plá, Jaime A. ; Wood, John
ISBN: 9780521336178

portada Modeling and Characterization of rf and Microwave Power Fets Paperback (The Cambridge rf and Microwave Engineering Series)

Modeling and Characterization of rf and Microwave Power Fets Paperback (The Cambridge rf and Microwave Engineering Series)

Type

Physical Book

Author

John Wood

Peter Aaen

Jaime A. Plá

Publisher

Cambridge University Press

Year

2011

Language

English

Pages

380

Format

Paperback

Dimensions

24.4 x 17.0 x 2.0 cm

Weight

0.60 kg.

ISBN

0521336171

ISBN13

9780521336178

Edition No.

Synopsis "Modeling and Characterization of rf and Microwave Power Fets Paperback (The Cambridge rf and Microwave Engineering Series) "

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

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Modeling and Characterization of rf and Microwave Power Fets Paperback (The Cambridge rf and Microwave Engineering Series) - Aaen, Peter ; Plá, Jaime A. ; Wood, John

Synopsis "Modeling and Characterization of rf and Microwave Power Fets Paperback (The Cambridge rf and Microwave Engineering Series) "

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