Name: Multi-Chip Module Test Strategies
SKU: 58190794
Price: 3355.00 TWD
Availability: InStock
Author: Zorian, Yervant
ISBN: 9781461377986

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portada Multi-Chip Module Test Strategies

Type

Physical Book

Publisher

Springer

Author

Zorian, Yervant

Language

English

Pages

167

Format

Paperback

ISBN13

9781461377986

Synopsis "Multi-Chip Module Test Strategies"

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

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Multi-Chip Module Test Strategies - Zorian, Yervant

Synopsis "Multi-Chip Module Test Strategies"

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