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portada Particle Characterization in Technology: Volume II: Morphological Analysis
Type
Physical Book
Author
Publisher
Language
English
Pages
288
Format
Hardcover
ISBN13
9781315896267
Edition No.
1
Categories

Particle Characterization in Technology: Volume II: Morphological Analysis

J. K. Beddow (Author) · CRC Press · Hardcover

Particle Characterization in Technology: Volume II: Morphological Analysis - Beddow, J. K.

New Book Imported to Taiwan
Delivery: 15 Oct - 23 Oct Shipping: 13 to 14 business days.
NT$ 9,675
NT$ 9,675

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Synopsis "Particle Characterization in Technology: Volume II: Morphological Analysis"

The first section of volume II deals with both theory and methods of morphological analysis, it then discusses data analysis, and finally, the applications.

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