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portada Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Type
Physical Book
Publisher
Language
English
Pages
276
Format
Hardcover
Dimensions
24.4 x 17.0 x 1.8 cm
Weight
0.64 kg.
ISBN13
9781839682292

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Kumar, Samir ; Pathak, Chandra Shakher (Author) · Intechopen · Hardcover

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization - Kumar, Samir ; Pathak, Chandra Shakher

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Synopsis "Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization"

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.

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