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portada Semiconductor Memory Testing: Fault Models and Test Considerations for High Performance Embedded SRAM's
Type
Physical Book
Publisher
Format
Paperback
ISBN13
9783639194401

Semiconductor Memory Testing: Fault Models and Test Considerations for High Performance Embedded SRAM's

Anuj Gupta (Author) · Vdm Verlag · Paperback

Semiconductor Memory Testing: Fault Models and Test Considerations for High Performance Embedded SRAM's - Anuj Gupta

New Book Imported to Taiwan
Delivery: 30 Oct - 12 Nov Shipping: 12 to 16 business days.
NT$ 1,997
NT$ 1,997

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