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portada Soft Error Mechanisms, Modeling and Mitigation
Type
Physical Book
Author
Publisher
Language
English
Pages
105
Format
Paperback
Dimensions
23.4 x 15.6 x 0.6 cm
Weight
0.18 kg.
ISBN13
9783319808482
Categories

Soft Error Mechanisms, Modeling and Mitigation

Selahattin Sayil (Author) · Springer · Paperback

Soft Error Mechanisms, Modeling and Mitigation - Sayil, Selahattin

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Synopsis "Soft Error Mechanisms, Modeling and Mitigation"

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

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