Name: understanding atomic force microscopy,basic modes for advanced applications
SKU: 4397724
Price: 5253.00 TWD
Availability: InStock
Author: Haugstad, Greg
ISBN: 9780470638828

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portada understanding atomic force microscopy,basic modes for advanced applications

understanding atomic force microscopy,basic modes for advanced applications

Type

Physical Book

Author

Greg Haugstad

Publisher

Wiley

Year

2012

Language

English

Pages

472

Format

Hardcover

Dimensions

23.6x15.7x3 cm

Weight

0.79 kg.

ISBN13

9780470638828

Synopsis "understanding atomic force microscopy,basic modes for advanced applications"

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. "Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"

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Synopsis "understanding atomic force microscopy,basic modes for advanced applications"

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