你好! Shipping to Taiwan with premium packaging for just NT$300 

Ship to
Taiwan
0
  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional

Select your country

Americas

Europe

Rest of the world

portada Updated Electronic Testbed System
Type
Physical Book
Publisher
Language
English
Pages
24
Format
Paperback
Dimensions
24.6x18.9x0.1 cm
Weight
0.06 kg.
ISBN13
9781288910939
Categories

Updated Electronic Testbed System

National Aeronautics and Space Administr (Author) · Kevin L. Brewer (Author) · Biblioscholar · Paperback

Updated Electronic Testbed System - National Aeronautics and Space Administr ; Brewer, Kevin L.

Cheaper New Book Imported to Taiwan
Delivery: 07 Oct - 20 Oct Shipping: 17 to 21 business days.
NT$ 879
Faster New Book Imported to Taiwan
Delivery: 30 Sep - 13 Oct Shipping: 12 to 16 business days.
NT$ 1,016
NT$ 879

Synopsis "Updated Electronic Testbed System"

As we continue to advance in exploring space frontiers, technology must also advance. The need for faster data recovery and data processing is crucial. In this, the less equipment used, and lighter that equipment is, the better. Because integrated circuits become more sensitive in high altitude, experimental verification and quantification is required. The Center for Applied Radiation Research (CARR) at Prairie View A&M University was awarded a grant by NASA to participate in the NASA ER-2 Flight Program, the APEX balloon flight program, and the Student Launch Program. These programs are to test anomalous errors in integrated circuits due to single event effects (SEE). CARR had already begun experiments characterizing the SEE behavior of high speed and high density SRAM's. The research center built a error testing system using a PC-104 computer unit, an Iomega Zip drive for storage, a test board with the components under test, and a latchup detection and reset unit. A test program was written to continuously monitor a stored data pattern in the SRAM chip and record errors. The devices under test were eight 4Mbit memory chips totaling 4Mbytes of memory. CARR was successful at obtaining data using the Electronic TestBed System (EBS) in various NASA ER-2 test flights. These series of high altitude flights of up to 70,000 feet, were effective at yielding the conditions which single event effects usually occur. However, the data received from the series of flights indicated one error per twenty-four hours. Because flight test time is very expensive, the initial design proved not to be cost effective. The need for orders of magnitude with more memory became essential. Therefore, a project which could test more memory within a given time was created. The goal of this project was not only to test more memory within a given time, but also to have a system with a faster processing speed, and which used less peripherals.

Customers reviews

Frequently Asked Questions about the Book

All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews