Name: A Study of Si-Ge Interdiffusion for SiGe based Semiconductor Devices
SKU: 46633574
Price: 2815.00 TWD
Availability: InStock
Author: Dong Yuanwei
ISBN: 9783659586699

Select your country

Americas

Argentina
Brazil
Canada
Chile
Colombia
Costa Rica
Dominican Republic
Ecuador
El Salvador
Mexico
Peru
U.S.A.
Spanish English
Uruguay

Europe

Austria
Belgium
Croatia
Czech Republic
Denmark
Finland
France
English French
Germany
Greece
Hungary
Ireland
Italy
Latvia
Malta
Netherlands
Norway
Poland
Portugal
Serbia
Slovakia
Slovenia
Spain
Sweden
Switzerland
United Kingdom

Rest of the world

Australia
China
Egypt
Hong Kong
India
Indonesia
Israel
Japan
Malaysia
New Zealand
Nigeria
Other Countries
Spanish English
Philippines
Saudi Arabia
Singapore
South Africa
South Korea
Taiwan
Thailand
United Arab Emirates
Vietnam

portada A Study of Si-Ge Interdiffusion for SiGe based Semiconductor Devices

A Study of Si-Ge Interdiffusion for SiGe based Semiconductor Devices

Type

Physical Book

Publisher

LAP Lambert Academic Publishing

Author

Dong Yuanwei

Format

Paperback

ISBN13

9783659586699

Customers reviews

Have you read this book? Login to add your review.

More customer reviews

0% (0)
0% (0)
0% (0)
0% (0)
0% (0)

Frequently Asked Questions about the Book

Is the book original?

All books in our catalog are Original.

What is the format of this book?

The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery