Name: High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip
SKU: 59266770
Price: 3355.00 TWD
Availability: InStock
Author: Wang, Zheng ; Chattopadhyay, Anupam
ISBN: 9789811093210

portada High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip

High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip

Type

Physical Book

Author

Anupam Chattopadhyay

Zheng Wang

Publisher

Springer

Language

English

Pages

197

Format

Paperback

Dimensions

23.4x15.6x1.2 cm

Weight

0.31 kg.

ISBN13

9789811093210

Synopsis "High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip"

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.

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High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip - Wang, Zheng ; Chattopadhyay, Anupam

Synopsis "High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip"

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