Name: infrared ellipsometry on semiconductor layer structures
SKU: 3412822
Price: 7292.00 TWD
Availability: InStock
Author: schubert
ISBN: 9783540232490

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portada infrared ellipsometry on semiconductor layer structures

infrared ellipsometry on semiconductor layer structures

Type

Physical Book

Publisher

Springer

Author

schubert

Language

English

Pages

193

ISBN

3540232494

ISBN13

9783540232490

Synopsis "infrared ellipsometry on semiconductor layer structures"

the study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. this book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. it describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. special emphasis is given to free-charge-carrier properties, and magneto-optical effects. a broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.