Name: microelectronic reliability vol. i: test and diagnostics
SKU: 19238176
Price: 6238.00 TWD
Availability: InStock
Author: Hakim, Edward B. ; Hakim, Edward B. ; Hakim, Edward B.
ISBN: 9780890062845

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portada microelectronic reliability vol. i: test and diagnostics

microelectronic reliability vol. i: test and diagnostics

Type

Physical Book

Author

Edward B. Hakim

Introduction by

Edward B. Hakim

Preface by

Edward B. Hakim

Publisher

Artech House Publishers

Year

1989

Language

English

Pages

396

Format

Hardcover

Dimensions

23.8x16.1x3 cm

Weight

0.77 kg.

ISBN

0890062846

ISBN13

9780890062845

Synopsis "microelectronic reliability vol. i: test and diagnostics"

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

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microelectronic reliability vol. i: test and diagnostics - Hakim, Edward B. ; Hakim, Edward B. ; Hakim, Edward B.

Synopsis "microelectronic reliability vol. i: test and diagnostics"

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