Name: Recent Interferometry Applications in Topography and Astronomy
SKU: 58974932
Price: 4577.00 TWD
Availability: InStock
Author: Padron, Ivan
ISBN: 9789535104049

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portada Recent Interferometry Applications in Topography and Astronomy

Recent Interferometry Applications in Topography and Astronomy

Type

Physical Book

Publisher

Intechopen

Author

Padron, Ivan

Language

English

Pages

234

Format

Hardcover

Dimensions

24.4x17x1.4 cm

Weight

0.57 kg.

ISBN13

9789535104049

Synopsis "Recent Interferometry Applications in Topography and Astronomy"

This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.

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Recent Interferometry Applications in Topography and Astronomy - Padron, Ivan

Synopsis "Recent Interferometry Applications in Topography and Astronomy"

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