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portada Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Type
Physical Book
Publisher
Year
2007
Language
English
Pages
689
Format
Hardcover
Weight
4
ISBN
0306472929
ISBN13
9780306472923

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Michael,Sawyer,Lifshin,Echlin,Lyman,Joy,Newbury,Goldstein (Author) · Springer · Hardcover

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Michael,Sawyer,Lifshin,Echlin,Lyman,Joy,Newbury,Goldstein

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Synopsis "Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition "

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.

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